Location: Liverpool,NY, USA
Location Liverpool, NY
No Remote **Senior Reliability Engineer Semiconductor** (110-130K)
We are seeking a Senior Reliability Engineer to work for an exciting high-technology semiconductor manufacturer in the Syracuse, NY area.
**Overview****:**
* Competitive Salary, Lucrative Stock Options, Medical / Dental Benefits, Unlimited PTO, and much more.
* Outstanding Career Opportunity to Join a Fast Growing Start-Up Manufacturer with over 100M in assets.
**Key Duties and Responsibilities****:**
* Work with academic research partners to gather electromigration data and analyze it to predict wearout lifetimes in operation.
* Lead investigation on stress migration and temperature driven IMC growth in metal films.
* Work with process and device engineers to build-in reliability for advanced power devices, including the effects of high voltage, high current, and temperature.
* Perform wafer-level and package-level testing on devices and test structures to characterize device and materials intrinsic strength and defectivity.
* Investigate implementation or procurement of high current/high voltage test systems for reliability and device stability measurements.
* Perform numerical simulations on devices for electrical and thermal reliability.
**Education and Experience****:**
* Ph.D. or MS degree in Electrical Engineering, Physics, Material Science, or related field.
* 5+ years of semiconductor experience.
* Familiarity with (GaN, GaAs, SiC, or Si).
* Experience with reliability test lab instrumentation and laboratory procedures.
* Experience with reliability data analysis using JMP or other data analysis software.
* Experience with power device processing, design, or reliability a plus.
* Experience with thermal characterization of semiconductors and/or semiconductor packages and modules a plus.
* Experience with test control software development or analysis automation a plus.
**Keywords****:**
Reliability, Fab Back End Reliability, Electromigration, Stress Migration, Metal Reliability, Wafer Level Reliability, JMP.